Navigation and service

Conductive or Not – Measuring Nanoswitches for Future Computers with Atomic Precision

Jülich, 22 June 2018 – A team of German and Polish scientists at Forschungszentrum Jülich has for the first time imaged the conductivity of metal oxide surfaces with atomic resolution. Using the new technique, innovative materials for information processing can be investigated and identified more easily. The oxide materials should help computers become more powerful and energy-efficient in future. Unlike other methods, the local-conductivity atomic force microscopy (LC-AFM) method used by the researchers can also be applied to surfaces with weak or inhomogeneous conductivity, which are typical of the material class.

Read more (in German)

Logo

 

 

 

YOUR OPINION MATTERS!

 

Dear visitor,

To make our website suit your needs even more and to give it a more appealing design, we would like you to answer a few short questions.

Answering these questions will take approx. 10 min.

Start now Close window

Thank you for your support!

 

In case you have already taken part in our survey or in case you have no time to take part now, you can simply close the window by clicking "close".

If you have any questions on the survey, please do not hesitate to contact: webumfrage@fz-juelich.de.

 

Your Team at Forschungszentrum Jülich

 

Note: Forschungszentrum Jülich works with the market research institute SKOPOS to anonymously conduct and analyze the survey. SKOPOS complies with the statutory requirements on data protection as well as with the regulations of ADM (Arbeitskreis Deutscher Markt- und Sozialforschungsinstitute e.V.) and ESOMAR (Europäische Gesellschaft für Meinungs- und Marketingforschung). Your data will not be forwarded to third parties.