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Bachelor thesis: Monitoring layer by layer growth with RHEED oscillations

Advertising institute: JCNS-2 - Scattering Methods
Reference number: D012/2013, Physics

When growing thin films the observation of the layer by layer growth is an important requisite for ultrasmooth surfaces and interlayers. This is achieved with RHEED, that is refractive high energy electron diffraction. Whithin this bachelor thesis thin films should be grown in our state of the art MBE system and the growth should be monitored with the built in RHEED. Further, the growth of single atomic layers should be optimized and the results should be compared with different characterization methods, e.g. XRR or XRD.

Contact persons: Markus Waschk, Alexander Weber
m.waschk@fz-juelich.de, al.weber@fz-juelich.de


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