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Bachelor thesis: Growth and characterization of SrRuO3 thin films

Advertising institute: JCNS-2 - Scattering Methods
Reference number: D019/2013, Physics

We offer a bachelor thesis in which crystalline strontium ruthanate (SRO) thin films will be grown on strontiumtitanate (STO) substrates by an oxide molecular beam epitaxy system and subsequently structurally characterized. Thin films of SrRuO3 have drawn wide applied interest as a conducting layer in epitaxial structures of complex oxides, in particular, as electrodes in oxide electronics. It is one of the few complex oxides that is metallic without doping. It has a good lattice match with a wide variety of functional oxides and therefore is relatively easy to incorporate in heterostructures.
The properties (e.g. lattice constants, conductivity) of those Perovskite oxides are highly dependent on oxygen vacancies in the crystal. The lattice constants of these SrRuO3 thin films should be characterized by x-ray reflectometry (XRR) and x-ray diffraction (XRD) in response to post annealing processes under different oxygen conditions. Additionally the surface quality should be characterized by atomic force microscopy (AFM).

Contact persons: Markus Schmitz, Alexander Weber
m.schmitz@fz-juelich.de, al.weber@fz-juelich.de


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