(leer)

Navigation and service


PGI Colloquium:

Prof. Dr. Leslie J. Allen,
University of Melbourne, Australia
 

PGI Lecture Hall, Building 04.8, 2nd Floor, Room 365

begin
14 Jul 2017 11:00

The Quest for Quantitative Analytical Microscopy at Atomic Resolution


AllenCopyright: Prof. Dr. Allen

Modern aberration-corrected electron microscopes are capable of a range of analytical techniques for atomic resolution materials analysis. In scanning transmission electron microscopy (STEM) mode, Z-contrast imaging is routinely used and in recent years has become a quantitative technique, making possible the counting of atoms and, more recently, the three-dimensional imaging of individual dopant atoms within small clusters. New detectors optimized for rapid x-ray collection in STEM enable energy dispersive x-ray (EDX) spectral mapping at the atomic scale. Electron energy loss spectroscopy (EELS) permits the user to collect low-loss and core-loss spectrum images as a function of probe position, providing complementary analytical information to EDX mapping. These techniques are made more powerful when coupled to an understanding of the elastic and inelastic scattering processes underlying the measured signals and substantial progress has been made towards making these techniques quantitative at the atomic scale.


Contact

Dr. Martina Luysberg
Phone: +49 2461 61-2417
Fax: +49 2461 61-6444
email: m.luysberg@fz-juelich.de

Servicemeu

Homepage