(leer)

Navigation and service


PGI Colloquium:

Prof. Dr. Peter Zeppenfeld,
Johannes Kepler University Linz (JKU), Linz, Austria
 

PGI Lecture Hall, Building 04.8, 2nd Floor, Room 365

begin
27 Apr 2018 11:00

Optical Spectroscopy of Surfaces, Thin Films and Nanostructures

Conceptually very simple optical methods, namely Reflectance Difference Spectroscopy (RDS/RAS) and Differential Reflectance Spectroscopy (DRS), can provide valuable insight into the structure and growth of ultrathin films in straight correlation with their electronic, optical and other physical or chemical properties.

Notably, these differential optical spectroscopies can achieve sub-monolayer sensitivity and are capable of monitoring kinetic processes on surfaces in real time. This will be illustrated in selected examples dealing with the fabrication and optical characterization of functional layers, such as reconstructed surfaces [1], graphene nanoribbons [2] and ultrathin molecular films [3,4]. While the spatial resolution in the UV-VIS range is naturally limited, microscopic information on the structure and electronic properties can be obtained from complementary surface science techniques such as STM and Photoemission Electron Microscopy (PEEM).

As an outlook, I will describe how optical spectroscopy and PEEM can be combined into a single experiment, thus enabling truly parallel optical spectroscopy and photoelectron microscopy at a local scale [5,6].

[1] L.D. Sun, M. Hohage, P. Zeppenfeld, Phys. Rev. B 69, 045407 (2004)
[2] R. Denk et al., Nat. Commun. 5, 4253 (2014) and Nanoscale 9, 18326 (2017)
[3] L.D. Sun, J. Gall, G. Weidlinger, C.Y. Liu, M. Denk, P. Zeppenfeld,
Phys. Rev. Lett. 110, 106101 (2013)
[4] J. Gall, L. Zhang, X. Fu, P. Zeppenfeld, L. D. Sun, Phys. Rev. B 96, 125424 (2017)
[5] E. Ghanbari, Th. Wagner, P. Zeppenfeld, J. Phys. Chem. C 119, 24174 (2015)
[6] A. Navarro Quezada, M. Aiglinger, E. Ghanbari, Th. Wagner, P. Zeppenfeld,
Rev. Sci. Instrum. 86, 113108 (2015)

Contact

Prof. Dr. Christian Kumpf
Phone: +49 2461 61-1452
Fax: +49 2461 61-3907
email: c.kumpf@fz-juelich.de

Servicemeu

Homepage

Logo

 

 

 

YOUR OPINION MATTERS!

 

Dear visitor,

To make our website suit your needs even more and to give it a more appealing design, we would like you to answer a few short questions.

Answering these questions will take approx. 10 min.

Start now Close window

Thank you for your support!

 

In case you have already taken part in our survey or in case you have no time to take part now, you can simply close the window by clicking "close".

If you have any questions on the survey, please do not hesitate to contact: webumfrage@fz-juelich.de.

 

Your Team at Forschungszentrum Jülich

 

Note: Forschungszentrum Jülich works with the market research institute SKOPOS to anonymously conduct and analyze the survey. SKOPOS complies with the statutory requirements on data protection as well as with the regulations of ADM (Arbeitskreis Deutscher Markt- und Sozialforschungsinstitute e.V.) and ESOMAR (Europäische Gesellschaft für Meinungs- und Marketingforschung). Your data will not be forwarded to third parties.