Advanced electron microscopy for nanoscience and nanotechnology
Prof. Dr. Rafal Dunin-Borkowski, Forschungszentrum Jülich, Peter Grünberg Institut (PGI-5)
- 13.Jul.2012 11:00
Transmission electron microscopy has been revolutionised in recent years, both by the introduction of new hardware such as field-emission electron guns, aberration correctors, monochromators, imaging filters and in situ stages and by the development of new techniques, algorithms and software that take advantage of increased computational speed and the ability to control and automate modern electron microscopes. In this talk, I will illustrate how both conventional and state-of-the-art electron microscopy techniques can be used to obtain unique information about materials and devices with high spatial resolution.
I will begin by describing how recent developments in transmission electron microscopy, which are based on advances in aberration-corrected imaging and microanalysis, have improved our ability to obtain quantitative information about the local microstructure and chemistry of materials at the atomic scale. I will then describe several specialised techniques in electron microscopy. One of the techniques involves the use of electron holography to measure variations in electrostatic potential and magnetic induction in semiconductor devices and nanomagnets examined as a function of applied voltage or magnetic field in situ in the electron microscope. When combined with electron tomography, quantitative information about electrostatic potentials and magnetic fields in materials can be obtained in three dimensions with sub-10-nm spatial resolution.
I was also present a personal perspecitive on directions for the future development of transmission electron microscopy instrumentation and techniques. When combined with advances in specimen preparation and automated image acquisition, such developments may ultimately lead to approaches for characterizing the positions, the chemical identities and the magnetic moments of individual atoms in three dimensions.
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