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Zeitschriftenbeiträge 2000


Infrared adsorption and hydrogen effusion of hydrogenated amorphous silicon-oxide films
Journal of non-crystalline solids 266-269, 845 (2000)  GO

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Comparative study of hydrogen stability in hydrogenated amorphous and crystalline silicon
Journal of non-crystalline solids 266-269, 206 (2000)  GO

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Characterization of DLC:Si films by the gas effusion technique
Diamond and related materials 9, 658 (2000)  GO


Optical gap and photoluminescence properties of amorphous silicon alloys
Philosophical magazine / B 80, 741 (2000)  GO

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Defect and disorder reduction by annealing in hydrogenated tetrahedral amorphous carbon
Diamond and related materials 9, 765 (2000)  GO

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Characterization of ultra-hard silicon carbide coatings deposited by RF magnetron sputtering
Thin solid films 377-378, S (2000) [10.1016/S0040-6090(00)01321-3]  GO

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Deposition of Si-DLC films with hardness, low stress and high deposition rates
Surface and coatings technology 133-134, 247 (2000)  GO

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Electronic properties of microcrystalline silicon investigated by electron spin resonance and transport measurements
Journal of non-crystalline solids 266-269, 511 (2000)  GO

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Characterization of the surfaces of hydrogen-passivated silicon by STM
Materials science and engineering / B 71, 244 (2000)  GO

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Multi-channel sensors with reduced metameric errors
Journal of non-crystalline solids 266-269, 1158 (2000)  GO

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Structural, electrical and optical characterization of semiconducting Ru2Si3
Microelectronic engineering 50, 243 (2000)  GO

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An explanation for the low-temperature H evolution peak in hydrogenated amorphous silicon films deposited "on the edge of crystallinity
Philosophical magazine / Letters 80, 647 (2000)  GO

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Hydrogen at compact sites in hot-wire chemical vapour deposited polycrystalline siliconfilms
Journal of non-crystalline solids 266-269, 194 (2000)  GO


Dünnschichtsolarzellen
Vakuum in Forschung und Praxis 5, 306 (2000)  GO

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Nucleation and growth of low-temperature fine-crystalline silicon : a scanning probe microscopy and raman spectroscopy study of the influence of hydrogen and different substrates
Materials science and engineering / B 72, 1 - 6 (2000)  GO

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Nucleation and growth analysis of microcrystalline silicon by scanning probe microscopy : substrate dependence, local structural and electron properties of As-grown surfaces
Journal of non-crystalline solids 266-269, 69 (2000)  GO

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Investigation of the optoelectronic properties of muc-Si:H pin solar cells
Journal of non-crystalline solids 266-269, 1104 - 1108 (2000)  GO

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The influences of adsorbates on the surface conductivity of chemical vapor deposited diamond
Applied physics letters 77, 1554 - 1556 (2000)  GO

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Transient behavior of pinip structures in three-terminal a-Si:H based three-color detectors
Journal of non-crystalline solids 266-269, 1178 (2000)  GO

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Room-temperature light-emitting diodes with Ge islands
Materials science in semiconductor processing 3, 383 (2000) [10.1016/S1369-8001(00)00059-7]  GO

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Size distribution and electroluminescence of self-assembled Ge dots
Journal of applied physics 87, 7275 (2000)  GO

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Intrinsic microcrystalline silicon: A new material for photovoltaics
Solar energy materials & solar cells 62(1-2), 97 - 108 (2000) [10.1016/S0927-0248(99)00140-3]  GO

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Spectral responsivity of single-quantum-well photodetectors
Applied physics letters 77, 16 (2000)  GO

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Fine structure of photoresponse spectra in double-barrier resonant tunneling diode
Nanotechnology 11, 305 (2000)  GO

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Properties of ion implanted epitaxial CoSi2/Si(100) after rapid thermal oxidation
Nuclear instruments & methods in physics research / B 164-165, 1004 (2000)  GO

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Thin film detector for color recognition : an experimental and numerical study
Journal of non-crystalline solids 266-269, 1173 (2000)  GO

Dissertationen 2000

Diplomarbeiten 2000

Beiträge in Büchern 2000

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Microstructure characterization of amorphous siliocon-based alloys by inert gas effusion studies
Amorphous and heterogeneous silicon thin films 2000 : symposium held April 24 - 28, 2000, San Francisco, California, USA / ed.: R. W. Collins ... - Warrendale,PA, 2001. - (MRS proceedings ; 609). - 1-55899-517-X. - S. A23.4.1 (2000)

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Dependence of H diffusion in hydrogenated silicon on doping and the Fermi level
Amorphous and heterogeneous silicon thin films 2000 : symposium held April 24 - 28, 2000, San Francisco, California, USA / ed.: R. W. Collins ... - Warrendale,PA, 2001. - (MRS proceedings ; 609). - 1-55899-517-X. - S. A20.4.1 (2000)

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Comparative study of microcrystalline silicon pin and nip diodes
16th European Photovoltaic Solar Energy Conference and Exhibition : Glasgow, May 2000 ; proceedings. - 1-902916-19-0. - S. 545 - 548 (2000)

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Temperature dependent transport in microcrystalline pin diodes
Amorphous and heterogeneous silicon thin films 2000 : symposium held April 24 - 28, 2000, San Francisco, California, USA / ed.: Robert W. Collins ... - (Materials Research Society Symposium proceedings ; 609). - 1-55899-517-X. - S. A32.3.1 (2000)

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SIMS and SNMS investigations concerning the segregation of Ni in Al during depth profiling with normal incidence oxygen bombardment
Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, Bruessels, 05 - 11.09.1999 / ed.: ed. by A. Benninghoven. - Amsterdam, 2000. - 0-444-50323-4. - S. 647 - 650 (2000)

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Measurement of impurity profiles in microcrystalline silicon solar cells by SIMS
Amorphous and heterogeneous silicon thin films 2000 : symposium held April 24 - 28, 2000, San Francisco, California, USA / ed.: R. W. Collins ... - Warrendale,PA, 2001. - (MRS proceedings ; 609). - 1-55899-517-X. - S. A13.5.1 (2000)

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Structure of Si:H films fabricated by plasma-enhanced CVD using hydrogen diluted plasma
Amorphous and heterogeneous silicon thin films 2000 : symposium held April 24 - 28, 2000, San Francisco, California, USA / ed.: R. W. Collins ... - Warrendale,PA, 2001. - (MRS proceedings ; 609). - 1-55899-517-X. - S. A5.8.1 (2000)

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Three and six channel sensors : realization and colorimetrical characterization
Flat-panel displays and sensors : principles, materials and processes ; symposium held April 4-9, 1999, San Francisco, California, USA / ed.: B. R. Chalamala ... - Warrendale,PA, 1999. - (MRS proceedings ; 558). - 1-55899-465-3. - S. 279 (2000)

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Role of bandgap grading for the performance of microcrystalline silicon germanium solar cells
Materials Research Society proceedings. - 557 (1999). - 1-55899-464-5. - S. 591 (2000)

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SIMS depth profile analysis of oxygen contamination in hydrogenated amorphous and microcrystalline silicon
Secondary Ion Mass Spectrometry : SIMS XII / ed. by A. Benninghoven ... - Amsterdam, 2000. - 0-444-50323-4. - S. 689 (2000)

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Upscaling of texture-etched zinc oxide substrates for silicon thin fim solar cells
Proceedings of the 3rd International Conference on Coatings on Glass : Maastricht, Niederlande. - S. 669 (2000)

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SIMS study of C and Al Co-implantation in GaAs
Secondary Ion Mass Spectrometry : SIMS XII / ed. by A. Benninghoven ... - Amsterdam, 2000. - 0-444-50323-4. - S. 693 (2000)

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Light Scattering in Microcrystalline Silicon Thin Film Solar Cells
Proceedings of the 16th European Photovoltaic Solar Energy Conference, Glasgow, Great Britain. - 2000. - 1-902916-19-0. - S. 549 - 552 (2000)

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More insight into the transient photocurrent response of three-color detectors
Materials Research Society proceedings. - 557 (1999). - 1-55899-464-5. - S. 833 (2000)

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Untersuchung der Oberflächenschicht von Perowskiten mit Hilfe von SIMS und SNMS
Entwicklung und Anwendung massenspektrometrischer Methoden zur Spuren-, Ultraspuren-, Isotopen- und Oberflächenanalytik für die Forschungsaufgaben des Forschungszentrums Jülich : 2 / Hrsg.: J. S. Becker. - Jülich, 2000. - (Berichte des Forschungszentrums Jülich ; 3821). - S. 253 - 263 (2000)

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Oxygen bombardment induced zinc segregation during depth profiling of ZnO/Si layered structures
Secondary Ion Mass Spectrometry : SIMS XII / ed. by A. Benninghoven ... - Amsterdam, 2000. - 0-444-50323-4. - S. 481 (2000)

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Reduced light degradation of a-SiGe:H based pin solar cells by 'w-shape' graded e-layer
16th European Photovoltaic Solar Energy Conference and Exhibition : Glasgow, May 2000 ; proceedings. - 1-902916-19-0. - S. 381 - 384 (2000)


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