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LEEM/PEEM-9

14-18 September 2014

Berlin, Germany

Scope

The LEEM/PEEM workshop is a biennial meeting reviewing the status of immersion lens microscopies such as Low Energy Electron Microscopy (LEEM), Photoelectron Emission Microscopy (PEEM), Spin-polarized LEEM (SPLEEM), X-Ray PEEM (XPEEM) and related microscopy and spectromicroscopy techniques. The first of these workshops was held in Tempe, Arizona, in 1998. Since then, the venue has moved between America, Europe and Asia. The main aim of the meeting is to discuss scientific advances in the fields of surface and solid state physics, disseminate knowledge and promote applications of cathode lens microscopy to a broad audience of interested scientists.

LEEM/PEEM 9 highlights the most recent scientific advances and instrumental developments in the field of cathode lens microscopy. Topics covered will include: 

  •            Surfaces
  •            Thin films
  •            Nanoparticles
  •            Organic films
  •            Surface chemistry
  •            Magnetism
  •            Spintronics
  •            Time-resolved methods
  •            Instrumental advances
  •            Novel applications of LEEM and PEEM

The programme will consist of oral, poster and tutorial sessions. The tradition of LEEM/PEEM having a single-session structure will also be upheld this year.

Additional Information

LEEM_PEEM Logo

 



Conference Office

Margret Frey

Forschungszentrum Jülich GmbH

Peter Grünberg Institute 

 

Phone: +49 2461 61-6139

Fax: +49 2461 61-2620

Email: lp9@fz-juelich.de

 

Conference Chair 

 

Prof. Claus M. Schneider 

Forschungszentrum Jülich GmbH 

Peter Grünberg Institute 

Electronic Properties (PGI-6) 

52425 Jülich, Germany


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