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GALAXI - High resolution diffractometer for GISAXS

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GALAXI (Gallium Anode Low-Angle X-ray Instrument) is a small angle X-ray diffractometer that has been designed to serve the needs of small angle scattering at grazing incidence (GISAXS).


GALAXI DiffraktometerGALAXI diffractometer with sample chamber and detector
Copyright: Forschungszentrum Jülich

GALAXI is useful for the investigation of structures in the order of D = 2 π/Q = 2 … 100 nm, even if the structures are deposited on a substrate that is not transparent for X-rays.
GALAXI uses the Bruker AXS Metaljet X-ray source, the laboratory X-ray source with the highest brilliance available today. Using parabolic optics, the X-ray beam is directed through the 4 m long collimation.
The sample can be adjusted in the beam with 2 translational and 2 rotational degrees of freedom.

GALAXI RöntgenquelleGALAXI X-ray source and first chamber of the collimation stage containing slit system and attenuator
Copyright: Forschungszentrum Jülich

As a small angle detector we use the Dectris Pilatus 1M. Its impressively low background allows 6 orders of magnitude signal/noise within a single detector picture.
The detector distance can be adjusted between ca. 80 cm and 350 cm to adapt the angular range and resolution to the requirements of the experiment.
The beam path is evacuated from the source up to the detector, and the samples are also located in the vacuum area.

GALAXI is used for the investigation of:

  • the structure of self-organized nanoparticle assemblies
  • size distribution of nanoparticles in solution
  • porosity in coating layers
  • the structure of liquid crystals

Further information:

Examples

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