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Vorträge 2013

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Band offsets at zincblende-wurtzite GaAs nanowire sidewall surfaces
4th Semicon Nano 2013, Lake Arrowhead, C.A., USA, 09/29/2013 - 10/04/2013 (2013)


Cross-sectional scanning tunneling microscopy of nitride semiconductors
Microscopy of Semiconductor Materials 18, Oxford, UK, 04/07/2013 - 04/11/2013 (2013)

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News from the non-polar GaN surface: Hidden surface states and intrinsic versus extrinsic Fermi-level pinning
40th Conference on the Physics and Chemistry of Semiconductor Interfaces PCSI-40, Waikoloa / Hawai, USA, 01/20/2013 - 01/24/2013 (2013)

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Details of the Mass Transfers during Growth and Capping of In(Ga)As/GaAs Quantum Dots
International Conference of Materials for Advance Technologies 2013, Singapore, Singapore, 06/30/2013 - 07/05/2013 (2013)

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Details of the Mass Transfers during Growth and Capping of In(Ga)As/GaAs Quantum Dots
40th International Symposium on Compound Semiconductors, Kobe, Japan, 05/19/2013 - 05/23/2013 (2013)

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Mass Transfers during Growth and Capping of In(Ga)As/GaAs Quantum Dots
Electronic Materials Conference 2013, South Bend, Indiana USA, 06/26/2013 - 06/28/2013 (2013)

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News from the non-polar GaN(10-10) surface: Hidden surface states and intrinsic versus extrinsic Fermi-level pinning
E-MRS 2013 Spring Meeting, Strasbourg, France, 05/27/2013 - 05/31/2013 (2013)


Metadislocation core structure in the CMA Al13Co4
DPG-Frühjahrstagung, Regensburg, Germany, 03/11/2013 - 03/12/2013 (2013)


Catalytic - active nanoparticles studied by aberration-corrected electron microscopy
3rd Symposium of Intermetallic Compounds in Catalysis, Chania / Crete, Greece, 06/19/2013 - 06/21/2013 (2013)


Catalytic- active nanoparticles studied by aberration-corrected electron microscopy
CEA - KIT - FZJ Joint Workshop, Karlsruhe, Germany, 07/03/2013 - 07/04/2013 (2013)


Catalytic - active nanoparticles studied by aberration-corrected electron microscopy
MPIE - ER-C Workshop, MPI für Eisenforschung, Düsseldorf, Germany, 07/16/2013 - 07/16/2013 (2013)

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Revealing Hidden Surface States of Non-Polar GaN Facets by an Ab Initio Tailored STM Approach
10th International Conference on Nitride Semicoductors, Washington DC, USA, 08/25/2013 - 08/30/2013 (2013)

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Reduction of silicon dioxide interfacial layer to 4.6 A EOT by Al remote scavenging in high-k/metal gate stacks on Si
18th Conference on 'Insulating Films on Semiconductors', INFOS2013, Krakau, Polen, 06/25/2013 - 06/28/2013 (2013)

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Growth and characteristics of lateral InAs nanowires on Si substrates
International Conference on One-Dimensional Nanomaterials, ICON, Annecy, France, 09/23/2013 - 09/26/2013 (2013)


On the optical stability of high-resolution transmission electron microscopes
PICO 2013, Second Conference on Frontieres of Aberration Corrected Electron microscopes, Kasteel Vaalsbroek, the Netherlands, 10/09/2013 - 10/12/2013 (2013)


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