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Vorträge 2013

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Band offsets at zincblende-wurtzite GaAs nanowire sidewall surfaces
4th Semicon Nano 2013, Meeting locationLake Arrowhead, C.A., USA, 29 Sep 2013 - 4 Oct 20132013-09-292013-10-04
(2013)


Cross-sectional scanning tunneling microscopy of nitride semiconductors
Microscopy of Semiconductor Materials 18, Meeting locationOxford, UK, 7 Apr 2013 - 11 Apr 20132013-04-072013-04-11
(2013)

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News from the non-polar GaN surface: Hidden surface states and intrinsic versus extrinsic Fermi-level pinning
40th Conference on the Physics and Chemistry of Semiconductor Interfaces PCSI-40, Meeting locationWaikoloa / Hawai, USA, 20 Jan 2013 - 24 Jan 20132013-01-202013-01-24
(2013)

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Details of the Mass Transfers during Growth and Capping of In(Ga)As/GaAs Quantum Dots
International Conference of Materials for Advance Technologies 2013, Meeting locationSingapore, Singapore, 30 Jun 2013 - 5 Jul 20132013-06-302013-07-05
(2013)

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Details of the Mass Transfers during Growth and Capping of In(Ga)As/GaAs Quantum Dots
40th International Symposium on Compound Semiconductors, Meeting locationKobe, Japan, 19 May 2013 - 23 May 20132013-05-192013-05-23
(2013)

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Mass Transfers during Growth and Capping of In(Ga)As/GaAs Quantum Dots
Electronic Materials Conference 2013, Meeting locationSouth Bend, Indiana USA, 26 Jun 2013 - 28 Jun 20132013-06-262013-06-28
(2013)

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News from the non-polar GaN(10-10) surface: Hidden surface states and intrinsic versus extrinsic Fermi-level pinning
E-MRS 2013 Spring Meeting, Meeting locationStrasbourg, France, 27 May 2013 - 31 May 20132013-05-272013-05-31
(2013)


Metadislocation core structure in the CMA Al13Co4
DPG-Frühjahrstagung, Meeting locationRegensburg, Germany, 11 Mar 2013 - 12 Mar 20132013-03-112013-03-12
(2013)


Catalytic - active nanoparticles studied by aberration-corrected electron microscopy
3rd Symposium of Intermetallic Compounds in Catalysis, Meeting locationChania / Crete, Greece, 19 Jun 2013 - 21 Jun 20132013-06-192013-06-21
(2013)


Catalytic- active nanoparticles studied by aberration-corrected electron microscopy
CEA - KIT - FZJ Joint Workshop, Meeting locationKarlsruhe, Germany, 3 Jul 2013 - 4 Jul 20132013-07-032013-07-04
(2013)


Catalytic - active nanoparticles studied by aberration-corrected electron microscopy
MPIE - ER-C Workshop, MPI für Eisenforschung, Meeting locationDüsseldorf, Germany, 16 Jul 2013 - 16 Jul 20132013-07-162013-07-16
(2013)

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Revealing Hidden Surface States of Non-Polar GaN Facets by an Ab Initio Tailored STM Approach
10th International Conference on Nitride Semicoductors, Meeting locationWashington DC, USA, 25 Aug 2013 - 30 Aug 20132013-08-252013-08-30
(2013)

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Reduction of silicon dioxide interfacial layer to 4.6 A EOT by Al remote scavenging in high-k/metal gate stacks on Si
18th Conference on 'Insulating Films on Semiconductors', INFOS2013, Meeting locationKrakau, RWTH Aachen, Polen, 25 Jun 2013 - 28 Jun 20132013-06-252013-06-28
(2013)

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Growth and characteristics of lateral InAs nanowires on Si substrates
International Conference on One-Dimensional Nanomaterials, ICON, Meeting locationAnnecy, France, 23 Sep 2013 - 26 Sep 20132013-09-232013-09-26
(2013)


On the optical stability of high-resolution transmission electron microscopes
PICO 2013, Second Conference on Frontieres of Aberration Corrected Electron microscopes, Meeting locationKasteel Vaalsbroek, the Netherlands, 9 Oct 2013 - 12 Oct 20132013-10-092013-10-12
(2013)


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