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Research Interests

Dr. Lothar Houben

  • heory of the interaction of the electron beam with semiconducting samples and the impact on the electrostatic potential on the basis of computer simulations for the interpretation of holographic images in the transmission electon microscope.
  • Structure determination in amorphous and nanocrystalline semiconductors in the transmission electron microscope and by X-ray diffraction.
  • Development of customized software for digital image processing and local layer composition analysis from hight-resolution transmission electron microscope images.


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