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In refereed journals 2010

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Compositional substitutions and aliovalent doping of BaTiO3-based thin films on Nickel foils prepared by chemical solutiion deposition
Journal of the American Chemical Society 93, 506 - 515 (2010) [10.1111/j.1551-2916.2009.03422.x]  GO

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Electronic transport properties of individual 4,4'-bis(mercaptoalkyl)-biphenyl derivatives measured in STM-based break junctions
Physical Chemistry Chemical Physics 12, 10518 - 10524 (2010) [10.1039/c004245e]  GO

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Formation sequence of lead platinum interfacial phases in chemical solution deposition derived Pb(Zr1-xTix)O-3 thin films
Chemistry of materials 22, 6209 - 6211 (2010) [10.1021/cm101195t]  GO

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Josephson supercurrent in Nb/InN-nanowire/Nb junctions
Applied physics letters 96, 132504 (2010) [10.1063/1.3377897]  GO

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Ferroelectric field effect transistors using very thin ferroelectric polyvinylidene fluoride copolymer films as gate dielectrics
Journal of applied physics 107, 124119 (2010) [10.1063/1.3437638]  GO

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High temperature conductance characteristics of LaAlO3/SrTiO3-heterostructures under equilibrium oxygen atmospheres
Applied physics letters 97, 012103 (2010) [10.1063/1.3457386]  GO

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Visualizing supercurrents in ferromagnetic Josephson junctions with various arrangements of 0 and pi segments
Physical review / B 81, 094502 (2010) [10.1103/PhysRevB.81.094502]  GO

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Identification of A- and B-site cation vacancy defects in perovskite oxide thin films
Physical review letters 105, 226102 (2010) [10.1103/PhysRevLett.105.226102]  GO

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Magnetic interference patterns in 0-pi superconductor/insulator/ferromagnet/superconductor Josephson junctions: Effects of asymmetry between 0 and pi regions
Physical review / B 81, 054522 (2010) [10.1103/PhysRevB.81.054522]  GO

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Study on the dynamic resistance switching properties of NiO thin films
Thin solid films 518, 2258 - 2260 (2010) [10.1016/j.tsf.2009.10.040]  GO

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Electronic Mapping of Molecular Orbitals at the Molecule-Metal Interface
Physical review letters 105, 066801 (2010) [10.1103/PhysRevLett.105.066801]  GO

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Oxide nitrides: From oxides to solids with mobile nitrogen ions
Progress in solid state chemistry 37, (2009) [10.1016/j.progsolidstchem.2009.11.004]  GO

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Soft x-ray resonant scattering study of single-crystal LaSr2Mn2O7
The European physical journal / B 74, 457 - 461 (2010) [10.1140/epjb/e2010-00117-3]  GO

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Complementary resistive switches for passive nanocrossbar memories Published online: 18 April 2010
Nature materials 9, 403 - 406 (2010) [10.1038/nmat2748]  GO

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Thermodynamics, structure and kinetics in the system Ga-O-N
Progress in solid state chemistry 37, (2009) [10.1016/j.progsolidstchem.2009.11.005]  GO

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Field emission resonances at tip/Mercaptoalkyl-ferrocene/Au interfaces
E Nano Newsletters 19, 28 - 29 (2010)  GO

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Correlation between growth kinetics and nanoscale resistive switching properties of SrTiO3 thin films
Journal of applied physics 108, 124504 (2010) [10.1063/1.3520674]  GO

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Coexistence of filamentary and homogeneous switching in Fe-doped SrTiO3 thin film memristive devices
Advanced materials 22, 4819 - 4822 (2010) [10.1002/adma.201001872]  GO

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Morphological and electical changes in TiO2 memristive devices induced by elecroforming and switching
Physica status solidi / Rapid research letters 4, (2010) [10.1002/pssr.200903347]  GO

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Investigation of the electroforming process in resistively switching TiO_2 nanocrosspoint junctions
Applied physics letters 96, 122902 (2010) [10.1063/1.3367752]  GO

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Comments on the processing of the niobium omponent for chemical solution derived niobium oxide-based thin films
Journal of sol gel science and technology 56, 236 - 243 (2010) [101007/s10971-010-2299-1]  GO

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Observation of unipolar resistance switching in silver doped methyl-silsesquioxane
Microelectronic engineering 87, (2010) [10.1016/j.mee.2009.11.034]  GO

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Interference patterns of multfacet 20x (0-pi) Josephson junctions with ferromagnetic barrier
Physical review / B 81, (2010) [10.1103/PhysRevB.81.174535]  GO

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SrTiO3 ultra thin film capacitors on silicon substrates with significant interfacial passive layers
Applied physics letters 97, 132907 (2010) [10.1063/1.3495990]  GO

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Voltage-time dilemma of pure electronic mechanisms in resistive switching memory cells
Journal of applied physics 107, 054517 (2010) [10.1063/1.3319591]  GO

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Reversible alternation between bipolar and unipolar resistive switching in polycrystalline barium strontium titanate thin films
Journal of applied physics 107, 094506 (2010) [10.1063/1.3369285]  GO

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Impact of defect distribution on resistive switching characteristics of Sr2tiO4 thin Films
Advanced materials 22, (2010) [10.1002/adma.200901493]  GO

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Probing Cu doped Ge_0.3Se_0.7 based resistance switching memory devices with random telegraph noise
Journal of applied physics 107, 024517 - 024527 (2010) [10.1063/1.3291132]  GO

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Evidence for triplet superconductivity in Josephson junctions with ferromagnetic Cu2MnAl-Heusler barriers
Physical review / B 82, 060505 (2010) [10.1103/PhysRevB.82.060505]  GO

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Liquid injection MOCVD grown binary oxides and ternary rare-earth oxide as alternate gate-oxides for logic devices
ECS transactions 33, 211 - 219 (2010) [10.1149/1.3481608]  GO

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Ionic and electronic conductivity of nitrogen-doped YSZ single crystals
Solid state ionics 180, (2009) [10.1016/j.ssi.2009.09.003]  GO

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Function by defects at the atomic scale - New concepts for non-volatile memories
Solid state electronics 54, 830 - 840 (2010) [10.1016/j.sse.2010.04.043]  GO

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The role of defects in resistively switching chalcogenides
International journal of materials research 101, 182 - 198 (2010) [10.3139/146.100276]  GO

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Critical current diffraction pattern of SIFS Josephson junctions with a step-like F-layer
Superconductor science and technology 23, 095007 (2010) [10.1088/0953-2048/23/9/095007]  GO

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Percolative BaTiO3-Ni composite nanopowders from alkoxide-mediated synthesis
Journal of the European Ceramic Society 30, 561 - 567 (2010) [10.1016/j.jeurceramsoc.2009.06.024]  GO

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Electronic conduction mechanisms in BaTiO3-Ni composites with ultrafine microstructure
Journal of the American Ceramic Society 93, 4075 - 4080 (2010) [10.1111/j.1551-2916.2010.04011.x]  GO


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