X-ray diffraction (XRD)
XRD is a non destructive technique for the structural analysis of crystalline samples.
XRD uses the effect that atoms (electrons) can scatter the incoming monochromatic X-rays resulting in a characteristic diffraction pattern due to Bragg’s law.
XRD can provide a qualitative and quantitative phase analysis, determination of the lattice parameters or residual stress, preferred orientation/texture and cystallite sizes.
The analysis will be performed by external collaborators. It is possible to use transmission as well as reflection set-ups.
Powders could be measured in transmission mode, solids or thin layers will be measured in reflection geometry.