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Central Institute for Engineering, Electronics and Analytics (ZEA)
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Localization

Competences in the field of localization are:

  • Element- and isotope-distribution (all chemical elements) in thin layers (- 2 µm) with high depth resolution (~ 1 nm) and on sufaces with a lateral resolution down to 0.1 µm (element- or isotope-mapping)
    - down to the ppb level Secondary Ion Mass Spectrometry (SIMS)
  • Determination of the concentration of minor and trace elements Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS)
    - in solids down to sub-ng/g and
    - precise isotope and isotope-ratio determination (e.g. Mg, Ca, Sr, Pb, U)
    - Imaging and quantification of elements with spatial resolution from 200 µm down to 5µm
  • Elements and their chemical bonding to surfaces (0.5 - 2 nm) (for z >= 3 (Li)) X-ray Photoelectronspectrocopy (XPS)
    and with high lateral resolution with Nano-XPS
  • Element composition determination (integral in a larger volume) for z > 8 Sequential X-Ray Fluorescence Analysis (XRF)
  • Confocal-laser- microscopy for mapping of objects on surfaces CL-Microscopy
  • Molecules on surfaces, surfaces under stress Raman spectroscopy and with high lateral resolution Nano-Raman
  • Analysis of materials and structures via micro-computer tomography with high resolution. 3-D reconstruction and visualization (Computertomographie)

Contact the expert:

Herr Dr. V. Nischwitz Tel. 1673 ((LA)-ICP-MS)
Frau Dr. A. Besmehn, Tel. 6774 (XRF, XPS, Nano-XPS)
Herr Dr. U. Breuer, Tel. 5364 (SIMS, CL-Mikroskopie)
Herr Dr. S. Küppers Tel. 2766 (Computertomographie)
Frau Dr. N. Lühmann Tel. 1673 (IR, Raman)


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