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Labs! Visit on Characterization by X-Ray Methods

25 Mar 2020 10:15
25 Mar 2020 11:00
building 04.6, room 003

Manuel Angst, Karen Friese
(Quantum Materials and Collective Phenomena)

Optimized samples are crucial for obtaining reliable and relevant measurement results. This requires continuous tuning of synthesis conditions based on physical characterization, in particular by x-ray diffraction. In this tour, the use of powder and four-circle diffractometers and a thin-film reflectometer for first characterization of samples is presented. In addition, a state-of-the-art single-crystal x-ray diffractometer designed to efficiently collect data for structure refinement in a wide temperature range is demonstrated and the data analysis is illustrated at the example of a complex oxide exhibiting ordering phenomena.

Online registration is mandatory and all places are subject to availability; you will receive an email confirmation once your place on the seminar is reserved. This lab visit will be offered twice, from 10:15am-11:00am, and from 11:15am to noon. When you register, please pay attention to the starting time.

This Labs! event is offered in collaboration with the IFF Spring School.