Scanning electron microscopes (SEM) and focused ion beam (FIB) instruments
Scanning electron microscopes
The JEOL 7400F is a scanning electron microscope equipped with a cold field emission gun and primarily to be used for analysis where ultra high resolution is required.
The JEOL 840A is a medium resolution scanning electron microscope used for conventional microstructure analyses.
Focused ion beam instruments
The FEI Helios NanoLab 460F1 is a highly advanced dual beam FIB-SEM platform for imaging and analytical measurements, transmission electron microscopy (TEM) sample and atom probe (AP) needle preparation, process development and process control.