Scanning electron microscopes (SEM) and focused ion beam (FIB) instruments

Instruments

Scanning electron microscopes

JEOL-7400F-SEM_small.jpg
JEOL Ltd.

The JEOL 7400F is a scanning electron microscope equipped with a cold field emission gun and primarily to be used for analysis where ultra high resolution is required.


JEOL-840A-SEM_small.jpg
FZ Jülich, ER-C

The JEOL 840A is a medium resolution scanning electron microscope used for conventional microstructure analyses.

Focused ion beam instruments

NanoLab-400S_small.jpg
FEI Company Inc.

The FEI Helios NanoLab 400S is a focused ion beam (FIB) system to be operated in dual beam mode.


More@er-c.org

NanoLab-460F1_small.png
FEI Company Inc.

The FEI Helios NanoLab 460F1 is a highly advanced dual beam FIB-SEM platform for imaging and analytical measurements, transmission electron microscopy (TEM) sample and atom probe (AP) needle preparation, process development and process control.

More@er-c.org

Last Modified: 02.06.2022