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Scanning electron microscopes (SEM) and focused ion beam (FIB) instruments

Instruments

Scanning electron microscopes

Description

The JEOL 7400F is a scanning electron microscope equipped with a cold field emission gun and primarily to be used for analysis where ultra high resolution is required.


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The JEOL 840A is a medium resolution scanning electron microscope used for conventional microstructure analyses.


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Focused ion beam instruments

Description

The FEI Helios NanoLab 400S is a focused ion beam (FIB) system to be operated in dual beam mode.


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The FEI Helios NanoLab 460F1 is a highly advanced dual beam FIB-SEM platform for imaging and analytical measurements, transmission electron microscopy (TEM) sample and atom probe (AP) needle preparation, process development and process control.

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