Microscopy and Tomography
For the investigation of microstructure – property relationships in electrochemical cells, novel ‘in-situ’ microscopy methods are developed and applied:
- ‘in-situ’ electron microscopy (SEM, TEM) with chemical analysis
- electrochemical atomic force microscopy (AFM)
- laser-scanning microscopy
- focused-ion beam (FIB) tomography
- X-ray tomography
Furthermore, ‘post-test’ and ‘post-mortem’ investigations are performed.
