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Sample preparation and pre-characterisation is a prerequisite when undertaking fundamental research on electronic and magnetic properties in polycrystalline materials, thin films and single crystals.
More: In-house X-Ray facilities …
More: GALAXI - High resolution diffractometer for GISAXS …
More: Poly-crystalline and single crystal sample preparation …
More: Thin film preparation …
More: MPMS, PPMS, CCMS …
More: AFM instrument …
