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LEEM/PEEM-9

14-18 September 2014

Berlin, Germany

Distinguished Guest Lecturers and Tutorial Instructors

Distinguished Guest Lecturers

Dr. Andrew Bass
Sherbrooke University, Canada
 Interactions of Slow Electrons with Organic Matter (PDF, 31 kB)
Prof. Harald Brune
EPFL Lausanne, Switzerland
 Honeycomb Networks as Templates for Magnetic Nanostructures (PDF, 26 kB)
Dr. Hermann Dürr
Stanford Linear Accelerator Center and LCLS, USA
 Imaging ultrafast spin dynamics with x-ray free electron lasers (PDF, 10 kB)
Prof. Jürgen Kirschner
Max Planck Institute of Microstructure Physics, Germany
 Experiments on the exchange-correlation hole in solids (PDF, 153 kB)
Prof. John M. Rodenburg
University of Sheffield, UK
 Ptychography: a revolution in atomic-scale microscopic imaging (PDF, 68 kB)
Dr. Tonica Valla
Brookhaven National Laboratory, USA
 Natural and Artificial Hetero-Structures Involving Topological Insulators (PDF, 9 kB)
Prof. Dr. Johan Verbeeck
University of Antwerp, Belgium
 The production and use of electron vortex beams (PDF, 48 kB)


Tutorial Instructors

The field of cathode lens microscopy has seen a strong progress in instrumental development over the last few years. The active correction of lens aberrations which was previously only available in transmission electron microscopes, has now been successfully introduced into LEEM and PEEM using an electron mirror concept. This results in an improvement of the transmission and the lateral resolution.
Another recent development concerns the study of fast and ultrafast processes at surfaces down to the femtosecond time scale. Implementing pump-probe techniques into cathode lens microscopy by short pulse excitation sources has given a unique access to magnetization or plasmon dynamics.

The improved experimental capabilities of cathode lens microscopy must be accompanied by a likewise enhanced understanding of the image formation from amplitude and phase objects and the image changes introduced by the electron optical lenses. The process of image evolution can be successfully described by the Contrast Transfer Function (CTF) method.

The above topics will be covered during the tutorial sessions on Sunday afternoon:

Prof. Michael S. Altman
Hong Kong University of Science and Technology, China
Image Formation Using Fourier Optics and Contrast Transfer Function
Prof. Rudolf M. Tromp
IBM Research Yorktown Heights, USA
Aberration Correction: Theory and Practice
Dr. Frank Meyer zu Heringdorf
University of Duisburg-Essen, Germany
Strategies for Time-Resolved Microscopy


 

Additional Information

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Conference Office

Margret Frey

Forschungszentrum Jülich GmbH

Peter Grünberg Institute 

 

Phone: +49 2461 61-6139

Fax: +49 2461 61-2620

Email: lp9@fz-juelich.de

 

Conference Chair 

 

Prof. Claus M. Schneider 

Forschungszentrum Jülich GmbH 

Peter Grünberg Institute 

Electronic Properties (PGI-6) 

52425 Jülich, Germany


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