Diffraction Methods and Electron Microscopy

The banner image shows a LEEM image of a 0°-rotated monolayer graphene on a 6H-SiC(0001) substrate prepared via the surfactant-mediated growth method.

About

Diffraction methods provide quantitative structural information of periodic structures and are therefore complementary to scanning probe microscopies. We employ both, electron and x-ray diffraction, to study molecular and quantum materials. Our aberration-corrected electron spectromicroscope plays a special role here, as it combines nanometer-resolved microscopy with micro-diffraction and spectroscopic capabilities.

Research Topics

  • Aberration-corrected spectromicroscopy
  • Chemically-resolved vertical structures with sub-Angstrom resolution
  • Interfaces between molecules and crystalline phases
  • Epitaxial 2D materials

Contact

Prof. Dr. Christian Kumpf

PGI-3

Building 02.4w / Room 319

+49 2461/61-1452

E-Mail

Members

Hao YinPhD studentBuilding 02.4w / Room 128+49 2461/61-6313
Monja StettnerPhD studentBuilding 02.4w / Room 128+49 2461/61-6313
Publication List

Recent publications

  • Susanne Wolff, Mark Hutter, Philip Schädlich, Hao Yin, Monja Stettner, Sabine Wenzel, Frank Stefan Stefan Tautz, François C. C. Bocquet, Thomas Seyller, Christian Kumpf; Bi-intercalated epitaxial graphene on SiC(0001). 25 September 2024 New Journal of Physics 10.1088/1367-2630/ad7f7d
  • Janina Felter, Jana Wolters, François C Bocquet, F Stefan Tautz, Christian Kumpf; Momentum microscopy on the micrometer scale: photoemission micro-tomography applied to single molecular domains. 25 January 2019 J. Phys.: Condens. Matter 31 114003 10.1088/1361-648X/aafc45
Last Modified: 17.10.2024