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Research Interests

Dr. Chunlin Jia

  • High-resolution transmission electron microscopy of ceramic materials.
  • Structure detemination through image analysis, image processing and image simulation.
  • Microstructure, morphology and residual strain of thin films and multi-layer systems of electroceramics, oxides and diamond on various substrates.
  • Atomic structure and chemistry of lattice defects such as dislocations, stacking faults, grain boundaries and interfaces in thin films and in multi-layer systems.

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