Dr. Chunlin Jia
- High-resolution transmission electron microscopy of ceramic materials.
- Structure detemination through image analysis, image processing and image simulation.
- Microstructure, morphology and residual strain of thin films and multi-layer systems of electroceramics, oxides and diamond on various substrates.
- Atomic structure and chemistry of lattice defects such as dislocations, stacking faults, grain boundaries and interfaces in thin films and in multi-layer systems.