Publication alert "Reliability effects of lateral filament confinement by nano-scaling the oxide in memristive devices”
15 Mar 2024
We fabricate a nano-device that laterally confines the switching oxide and filament to 10 nm. Electrical measurements demonstrate lower variability and reduced ionic noise compared to unconfined filaments, which is supported by our 3D simulation.
“Reliability effects of lateral filament confinement by nano-scaling the oxide in memristive devices”, P. Stasner, N. Kopperberg, K. Schnieders, T. Hennen, S. Wiefels, S. Menzel, R. Waser, D. J. Wouters Nanoscale Horizons, Issue 5, 9, 764-774 (2024) https://doi.org/10.1039/D3NH00520H
Last Modified: 11.02.2025