Growth and in-situ characterization of oxide thin films & devices
About
In the workgroup 'Growth and in-situ characterization of oxide thin films and devices', we are exploring novel synthesis and in-situ characterization routes for memristive and neuromorphic materials. The focus of the group is on the understanding and active engineering of functional oxides, including defect-engineering as well as epitaxial design of oxide thin films, heterostructures, nanoisland and free-standing films. The ongoing research ranges from memristive functionality for neuromorphic computing to ferroelectric, magnetoionic and quantum phenomena in complex oxide thin films. The team led by Prof. Regina Dittmann has established major infrastructures for the in-situ analysis of thin films, such as the Electronic Oxide Cluster, lab-scale and large-area PLD, as well as in-house X-ray spectroscopy (XPS, NanoESCA) and collaborates with synchrotron-facilities (e.g. MAX IV, Lund) for micro-spectroscopic analysis of memristive systems.