Dr. Thibaud Denneulin

Scientific staff at ER-C-1

Forschungsthemen

Electromagnetic field mapping group

Kontaktperson

+49 2461/61-6644

E-Mail

ORCID

Adresse

Forschungszentrum Jülich GmbH
Wilhelm-Johnen-Straße
52428 Jülich

Ernst Ruska-Centrum für Mikroskopie und Spektroskopie mit Elektronen (ER-C)

Physik Nanoskaliger Systeme (ER-C-1)

Gebäude 05.2 / Raum 3003

Warum und woran ich forsche

Electron microscopist for the DARPA-funded project entitled “Manipulation of magnetic
skyrmions for logic-in-memory applications”
Characterization of heavy metal/ferromagnetic multilayer samples using transmission
electron microscopy (TEM)
Magnetic imaging of Néel-type skyrmions and domain walls using electron holography and
Fresnel images

Vita

Education/Research experience:

since 2017	Post-doctoral Researcher - Forschungszentrum Jülich GmbH, Germany, Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons - Electromagnetic field mapping group
2013-2017	Post-doctoral Researcher - CEMES (Center for fabrication and structural characterization of materials) CNRS, Electron microscopy group, Toulouse, France
2009-2012	Ph.D. Student - CEA-LETI (Laboratory of electronics and information technologies) - Physical characterization laboratory, Electron microscopy group, Grenoble, France
2009 6 months	Internship - CEA-LETI - Laboratory of lithography, Metrology group Grenoble, France
2008 5 months	Internship - Alchimer company, Massy, France Electrochemical grafting of polymers on silicon wafers
2007 4 months	Internship - ESPCI (School of Industrial Physics and Chemistry) - Laboratory of analytical chemistry, Paris, France Scanning electrochemical microscopy (SECM) for the polymerization of surfaces.

Detailed cv

Publikationen

“Local deformation gradients in epitaxial Pb(Zr0.2Ti0.8)O3 layers investigated by transmission electron microscopy"
T Denneulin, N Wollschläger, A S Everhardt, S Farokhipoor, B Noheda, E Snoeck and M Hÿtch, ”, Journal of Physics: Condensed Matter 30, 21 (2018)

v NN Ledentsov, VA Shchukin, Yu M Shernyakov, MM Kulagina, AS Payusov, N Yu Gordeev, MV Maximov, AE Zhukov, T Denneulin, N Cherkashin, “Room-temperature yellow-orange (In, Ga, Al) P–GaP laser diodes grown on (n11) GaAs substrates” Optics Express 26, 13985-13994 (2018)

“Differential phase-contrast dark-field electron holography for strain mapping”
T Denneulin, F Houdellier, M Hÿtch, Ultramicroscopy 160, 98-109 (2016), http://dx.doi.org/10.1016/j.ultramic.2015.10.002

“Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope”
D Cooper, T Denneulin, N Bernier, A Béché, JL Rouvière, , Micron 80, 145-165 (2015), http://dx.doi.org/10.1016/j.micron.2015.09.001

“The reduction of the substitutional C content in annealed Si/SiGeC superlattices studied by dark-fieldelectron holography”
T Denneulin, JL Rouvière, A Béché, M Py, JP Barnes, N Rochat, JM Hartmann, D Cooper, Semiconductor Science and Technology26, 125010 (2011), Online at stacks.iop.org/SST/26/125010

Letzte Änderung: 04.11.2025