Fundamentals of Corrected Electron Optics and Electron-Matter Interaction

About

How can we see and understand the smallest building blocks of our world? Advanced imaging tools allow us to explore the atomic structures that define the properties of materials. In tools such as advanced transmission electron microscopes, we use beams of fast-moving electrons to reveal details invisible to the human eye.

Precisely controlled by about one hundred electron lenses, these instruments produce high-resolution images in which atoms become visible. By modeling how electrons interact with matter and form images, we support the design of new materials that will shape our future.

Research Topics

  • quantitative high-resolution transmission electron microscopy technique development for instrument characterization
  • development of practicable models for electron scattering
  • software development and application for electron image and spectrum simulation

Contact

Dr. Juri Barthel

ER-C-2

Building 05.2w / Room 3077

+49 2461/61-9277

E-Mail

Publications

Recent publications

J. Barthel, L.J. Allen, Practicable model for phonon spectroscopy at atomic resolution in scanning transmission electron microscopy for thick crystalline specimens, Phys. Rev. B111 (2025) 054119.

J. Barthel, L.J. Allen, Interpretation of phonon spectroscopic data at atomic resolution in scanning transmission electron microscopy, Phys. Rev. B 110 (2024) 094105.

N. Gumbiowski, J. Barthel, K. Loza, M. Heggen, M. Epple, Simulated HRTEM images of nanoparticles to train a neural network to classify nanoparticles for crystallinity, Nanoscale Adv. 6 (2024) 4196.

P.M. Zeiger, J. Barthel, L.J. Allen, J. Rusz, Lessons from the harmonic oscillator: Reconciliation of the frequency-resolved frozen phonon multislice method with other theoretical approaches, Phys. Rev. B 108 (2023) 094309.

J. Barthel, L.J. Allen, Role of ionization in imaging and spectroscopy utilizing fast electrons that have excited phonons, Phys. Rev. B 104 (2021) 104108.

M. Nord, J. Barthel, C.S. Allen, D. McGrouther, A.I. Kirkland, I. MacLaren, Atomic resolution HOLZ-STEM imaging of atom position modulation in oxide heterostructures, Ultramicroscopy 226 (2021) 113296.

J. Barthel, M. Cattaneo, B.G. Mendis, S.D. Findlay, L.J. Allen, Angular dependence of fast-electron scattering from materials, Phys. Rev. B 101 (2020) 184109.

B.G. Mendis, J. Barthel, S.D. Findlay, L.J. Allen, Inelastic Scattering in Electron Backscatter Diffraction and Electron Channeling Contrast Imaging, Microscopy and Microanalysis 26 (2020) 1147-1157.

F. Winkler, J. Barthel, A.H. Tavabi, S. Borghardt, B.E. Kardynal, R.E. Dunin-Borkowski, Absolute Scale Quantitative Off-Axis Electron Holography at Atomic Resolution, Phys. Rev. Lett. 120 (2018) 156101.

J. Barthel, Dr. Probe: A software for high-resolution STEM image simulation, Ultramicroscopy 193 (2018) 1-11.

L. Jin, J. Barthel, C.-L. Jia, K.W. Urban, Atomic resolution imaging of YAlO3:Ce in the chromatic and spherical aberration corrected PICO electron microscope, Ultramicroscopy 176 (2017) 99-104.

S.L.Y. Chang, C. Dwyer, J. Barthel, C.B. Boothroyd, R.E. Dunin-Borkowski, Performance of a direct detection camera for off-axis electron holography, Ultramicroscopy 161 (2016) 90-97.

J. Barthel, A. Thust, On the optical stability of high-resolution transmission electron microscopes, Ultramiscroscopy 134 (2013) 6-17.

J. Barthel, A. Thust, Quantification of the Information Limit of Transmission Electron Microscopes, Phys. Rev. Lett. 101 (2008) 200801.

Last Modified: 07.03.2025