Journals
Laser-Induced Degradation of Bi2Se3 THz Emitters Revealed by Raman Spectroscopy
Photonics 13(3), 278 - (2026) [10.3390/photonics13030278]
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Intermediate Resistive State in Wafer‐Scale Vertical MoS 2 Memristors Through Lateral Silver Filament Growth for Artificial Synapse Applications
Advanced functional materials 1, e26682 (2026) [10.1002/adfm.202526682]
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Reduced Variability in Threshold Switches Using Heterostructures of SiO x and Vertically Aligned MoS 2
Advanced electronic materials 12(7), e00800 (2026) [10.1002/aelm.202500800]
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