Other contributions
Abstract
Study of GeSn/(Si)Ge(Sn) Quantum Structures for Light Emitters
SPIE Europe, BrüsselBrüssel, Belgien, 3 Apr 2016 - 7 Apr 2016
Files Fulltext by OpenAccess repository
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a book
Scanning Probe Microscopy
Memristive Phenomena - From Fundamental to Neuromorphic Computing
Jülich : Forschungszentrum Jülich 619 pp. (2016)
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a book
Ternary Rare Earth Based Oxides for Nitride Based Devices
Pennington, NJ : Electrochemical Society (ECS), ECS transactions 72, 307 - 317 (2016) [10.1149/07202.0307ecst]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings
Zig-zag self-assembly of magnetic octahedral Fe3O4 nanocrystals using in situ liquid transmission electron microscopy
3rd International Conference on In Situ and Correlative Electron Microscopy, SaarbrückenSaarbrücken, Germany, 11 Oct 2016 - 12 Oct 2016
36 - 37 (2016)
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings
Introduction to a special issue on Frontieres of Aberration Corrected Electron Microscopy in honour of Robert Sinclair and Nestor J. Zaluzec on the occasion of their 70th and 65th birthdays
PICO 2017, Kasteel VaalsbroekKasteel Vaalsbroek, The Netherlands, 30 Apr 2017 - 4 May 2017
Amsterdam : Elsevier Science (2016)
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings
Introduction to a Special Issue on Frontiers of Aberration Corrected Electron Microscopy dedicated to Harald Rose on the occasion of his 80th Birthday
Pico 2015, Kasteel VaaslbroekKasteel Vaaslbroek, The Netherlands, 19 Apr 2015 - 23 Apr 2015
Amsterdam : Elsevier Science (2016)
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings
Measurement of atomic eletric fields by scanning transmission electron microscopy (STEM) employing ultrafast detectors
Microscopy and Microanalysis, ColumbusColumbus, OH, 24 Jul 2016 - 28 Jul 2016
New York, NY : Cambridge University Press 484 - 485 (2016)
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings
(Si)GeSn nanostructures for light emitters
SPIE Photonics Europe, BrusselsBrussels, Belgium, 3 Apr 2016 - 7 Apr 2016
98910W-1-98910W-9 (2016) [10.1117/12.2227573]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings
Quantitative measurement of the charge distribution along a tungsten nanotip using transmission electron holography
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 737 - 738 (2016) [10.1002/9783527808465.EMC2016.6252]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Low dose electron holography using direct-electron detection camera
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 769 - 770 (2016) [10.1002/9783527808465.EMC2016.6971]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Fabrication and characterization of a fine electron biprism on a Si-on-insulator MEMS chip
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 699 - 700 (2016) [10.1002/9783527808465.EMC2016.6259]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Automated in situ transmission electron microscopy experiments
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress, LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 638 - 639 (2016) [10.1002/9783527808465.EMC2016.6434]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Limitations and challenges in off-axis electron holography of electromagnetic fields in nanoscale materials
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 677 - 678 (2016) [10.1002/9783527808465.EMC2016.8663]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Growth and degradation of advanced octahedral Pt-alloy nanoparticle catalysts for fuel cells
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 800 - 801 (2016) [10.1002/9783527808465.EMC2016.6030]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
In situ TEM analysis of structural changes in metal-halide perovskite solar cells under electrical bias
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 804 - 805 (2016) [10.1002/9783527808465.EMC2016.6370]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Atomic resolution HR(S)TEM and EDXS analyses of GaInAs/GaSb and GaInP/GaSb bond interfaces for high-efficiency solar cells
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress, LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 846 - 847 (2016) [10.1002/9783527808465.EMC2016.6029]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Magnetic imaging of skyrmions in FeGe using off-axis electron holography
European Microscopy Congress 2016: Proceedings / Kovács, András ;ISBN: 9783527808465
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 739 - 740 (2016) [10.1002/9783527808465.EMC2016.6276]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Magnetic Skyrmions in an FeGe Nanostripe Revealed by in situ Electron Holography
European Microscopy Congress 2016: Proceedings / Li, Zi-An ISBN: 9783527808465
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 974 - 975 (2016) [10.1002/9783527808465.EMC2016.6263]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Electron beam lithography for the realization of electron beam vortices with large topological charge ( L=1000ħ)
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 390 - 391 (2016) [10.1002/9783527808465.EMC2016.5721]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Electron tomography with sub-5-second temporal resolution for dynamic in situ transmission electron microscopy
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 21 - 22 (2016) [10.1002/9783527808465.EMC2016.6191]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
The influence of Yb and Bi doping on the thermoelectric properties of Mg2Si0.4Sn0.6 studied using transmission electron microscopy
European Microscopy Congress 2016: Proceedings / Mohamadi, Maryam Beig ;ISBN: 9783527808465
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 1046 - 1047 (2016) [10.1002/9783527808465.EMC2016.6207]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Nitride layers grown on patterned graphene/SiC
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 630 - 631 (2016) [10.1002/9783527808465.EMC2016.6338]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Generation of super-oscillatory electron beams beyond the diffraction limit
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 731 - 732 (2016) [10.1002/9783527808465.EMC2016.6221]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Scanning electron diffraction using the pnCCD (S)TEM Camera
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 641 - 641 (2016) [10.1002/9783527808465.EMC2016.5224]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Imaging of Electric Fields with the pnCCD (S)TEM Camera
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 376 - 377 (2016) [10.1002/9783527808465.EMC2016.6328]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Quantitative STEM - From composition to atomic electric fields
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 552 - 553 (2016) [10.1002/9783527808465.EMC2016.8302]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Extending the Limits of Fast Acquisition in TEM Tomography and 4D-STEM
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 51 - 52 (2016) [10.1002/9783527808465.EMC2016.5295]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Double crystal interference experiments
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 711 - 712 (2016) [10.1002/9783527808465.EMC2016.5140]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
2016Decoupling of valence and coordination number contributions at perovskite surfaces
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 934- 935 (2016) [10.1002/9783527808465.EMC2016.6949]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Atomic structure and magnetic circular dichroism of antiphase boundary defects in NiFe2O4 thin films
European Microscopy Congress 2016: Proceedings / Wang, Zechao ; ISBN: 9783527808465
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 1058 pp. (2016) [10.1002/9783527808465.EMC2016.6384]
BibTeX |
EndNote:
XML,
Text |
RIS
Contribution to a conference proceedings/Contribution to a book
Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 417 - 418 (2016) [10.1002/9783527808465.EMC2016.6494]
Files
BibTeX |
EndNote:
XML,
Text |
RIS
Proceedings
Generation of super-oscillatory beams beyond the diffraction limit
the 16th European Microscopy Congress, LyonLyon, France, 28 Aug 2016 - 2 Sep 2016
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA (2016)
BibTeX |
EndNote:
XML,
Text |
RIS
Lecture (Invited)
Rastertunnelmikroskopie und- Spektroskopie von III-V Halbleiter Nanodrähten
Lecture at EFDS Workshop: von Nano bis Makro: neue bildgebende Untersuchungsverfahren für Qualitätskontrolle und Materialforschung (Dresden, Deutschland), 8 Nov 2016 - 9 Nov 2016
BibTeX |
EndNote:
XML,
Text |
RIS
Patent
Electrostatic biprism
Fulltext
BibTeX |
EndNote:
XML,
Text |
RIS
Patent
Measuring Instrument, electrical resistance elements and measuring System for measuringtime - variable magnetic fields or field gradients
BibTeX |
EndNote:
XML,
Text |
RIS
Patent
Reproducible step edge Josephson junction
BibTeX |
EndNote:
XML,
Text |
RIS
Patent
Sputtering sources for high-pressure sputtering with large targets and sputtering method
BibTeX |
EndNote:
XML,
Text |
RIS
Patent
Verfahren und Vorrichtungen zur Modulation eines Strahls elektrisch geladener Teilchen sowie Anwendungsbeispiele für die praktische Anwendung solcher Vorrichtungen
BibTeX |
EndNote:
XML,
Text |
RIS
Patent
Verfahren und Vorrichtungen zur Modulation eines Strahls elektrisch geladener Teilchen sowie Anwendungsbeispiele für die praktische Anwendung solcher Vorrichtungen
Fulltext
BibTeX |
EndNote:
XML,
Text |
RIS
Patent
Ionically controlled three-gate component
BibTeX |
EndNote:
XML,
Text |
RIS
Patent
Tunable Ampere phase plate for charged particle imaging systems
Fulltext
BibTeX |
EndNote:
XML,
Text |
RIS