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Aberration corrected transmission electron microscopes

Description

Aberration corrected electron microscopesCopyright: FEI Company Inc.



The FEI Titan G2 80-200 ChemiSTEM is a remotely operated field emission gun (scanning) transmission electron microscope equipped with a high-brightness Schottky field emission electron gun


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The FEI Titan G2 60-300 HOLO is a field emission gun transmission electron microscope designed for electron holography and in situ TEM analyses.


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The FEI Titan 50-300 PICO is a unique fourth generation field emission gun transmission electron microscope equipped with a high-brightness electron gun, a monochromator unit, and a Cs probe corrector.


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The FEI Titan 80-300 STEM is a field emission gun scanning transmission electron microscope equipped with a probe spherical aberration corrector element along with an electron monochromator and a post column energy filter system.

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The FEI Titan 80-300 TEM is a field emission gun transmission electron microscope equipped with an imaging spherical aberration corrector element.


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Transmission electron microscopes

Description


The Tecnai G2 F20 is a versatile field emission transmission electron microscope ideally suited for studying a wide range of general and advanced solid state materials.


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Zeiss Libra 120 TEM

Instruments for biological samples

Description


The TFS Talos 120C transmission electron microscope is a screening microscope suitable for negative staining and cryo samples.


The TFS Talos Arctica is a 200 kV field emission gun transmission cryo electron microscope designed for high resolution structure determination. It is equipped with a Gatan Bioquantum K3 direct electron detector with an energy filter.


The TFS Vitrobot Mark IV plunge freezer is used for cryo sample preparation. Samples are automatically blotted and rapidly frozen in liquid ethane to embed biological samples in vitreous ice.

Scanning electron microscopes

Description

The JEOL 7400F is a scanning electron microscope equipped with a cold field emission gun and primarily to be used for analysis where ultra high resolution is required.


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The JEOL 840A is a medium resolution scanning electron microscope used for conventional microstructure analyses.


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Focused ion beam instruments

Description

The FEI Helios NanoLab 400S is a focused ion beam (FIB) system to be operated in dual beam mode.


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The FEI Helios NanoLab 460F1 is a highly advanced dual beam FIB-SEM platform for imaging and analytical measurements, transmission electron microscopy (TEM) sample and atom probe (AP) needle preparation, process development and process control.

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