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Magnetic nanostructures

Structural and magnetic correlations in thin film systems are relevant to magneto-electronics. These correlations are studied on a length scale close to the spin diffusion length of the electrons. They can be used to observe interfacial roughness, magnetic domains or magnetic roughness.

Interface characterization of GMR systems

interfacegmr_jpg

The magnetoelectronics properties (interlayer coupling, magnetoresistance) of thin film devices depend strongly on their interface morphologies. A non-destructive characterization can be performed by x-ray scattering under grazing incidence. The form factor contrast between the layers can be significantly enhanced by anomalous scattering at a synchrotron radiation source. The figure shows off-specular scattering from an Fe/Cr/Fe trilayer at two x-ray energies, once for vanishing contrast and once for maximal contrast between Fe and Cr, leading to a very different modulation of the measured intensities.

Contact: Emmanuel Kentzinger

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