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Scanning Probe Microscopy
- Atomic Force Microscopy and Scanning Tunneling Microscopy
Bert Voigtländer

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

  • Presents the state-of-the-art in scanning probe techniques
  • Combines basic physical principles and their application to scanning tunneling and atomic force microscopes
  • Useful study text for graduate students and also useful reference to researchers

Publishing information:

Scanning Probe Microscopy
- Atomic Force Microscopy and Scanning Tunneling Microscopy
Author: Bert Voigtländer
Springer 2015, 406 p. 148 illus. in color.
ISBN 978-3-662-45239-4 (hardback), ISBN 978-3-662-45240-0 (eBook)
Publishers website of the book


Sidney Cohen, MRS Bulletin, Vol. 41, February, 2016, p. 165:

“The book attempts to provide a technical, theoretical, and conceptual framework to understand how SPM works and what can be done with it so that a reader wishing to further learn about newer topics will have the basis to do so. This book could thus serve as a useful reference and textbook for anyone desiring an advanced introduction to the fascinating world of SPM.”

The complete review can be found here.


Jascha Repp, Physik Journal, issue 4, 2016, p. 56 (translated from German):

“The contents of this book are presented in a very clear didactic manner ... . In addition, it includes the foundations of many technical aspects that are not necessarily a part of the methods themselves, but which in practice are required for the application. ... What I particularly like, is the fact that it discusses common artefacts occurring in scanning tunneling microscopy. Such discussions are rare in the literature, although they are essential for a complete training of young scientists. To my mind the book is well suited not only for physicists, but also for chemists, materials and nano-scientists and others with similar background.”

The complete review can be found here.

Customer Reviews:

Customer reviews can be found here and here.


Errata are posted here.

Supplementary Material:

Supplementary material will be posted here.


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