Atomic Force Microscopy (AFM)

For thin film and substrate surface characterization, atomic force microscopy is an invaluable technique. We are equipped with an Agilent 5400 AFM/SPM, a versatile and easy-to-use scanning probe microscope which allows contact and non-contact AFM for measuring topographic information; electric force microscopy (EFM), magnetic force microscopy (MFM) and force modulation modes at room temperature and ambient conditions to gain insight into electrostatic force phenomena and magnetic domains at the sample surface. Scans are analyzed with the open-source software Gwyddion.

Forschungszentrum Jülich

Location: Geb. Nr. 4.8, Room No.: N 024A, Ph: 4259


Dr. Connie Bednarski-Meinke

JCNS-2, PGI-4: Scientific Staff

  • Jülich Centre for Neutron Science (JCNS)
  • Quantum Materials and Collective Phenomena (JCNS-2 / PGI-4)
Building 04.8 /
Room 306
+49 2461/61-1941

Last Modified: 26.06.2023