Diffraction Methods and Electron Microscopy
The banner image shows a LEEM image of a 0°-rotated monolayer graphene on a 6H-SiC(0001) substrate prepared via the surfactant-mediated growth method.
About
Diffraction methods provide quantitative structural information of periodic structures and are therefore complementary to scanning probe microscopies. We employ both, electron and x-ray diffraction, to study molecular and quantum materials. Our aberration-corrected electron spectromicroscope plays a special role here, as it combines nanometer-resolved microscopy with micro-diffraction and spectroscopic capabilities.
Research Topics
- Aberration-corrected spectromicroscopy
- Chemically-resolved vertical structures with sub-Angstrom resolution
- Interfaces between molecules and crystalline phases
- Epitaxial 2D materials
Members
Monja StettnerPhD student at Peter Grünberg Institute (PGI-3) Building 02.4w / Room 128+49 2461/61-6313
Research
Recent Publications
- N. Tilgner, S. Wolff, S. Soubatch, T.-L. Lee, A. D. Pena Unigarro, S. Gemming, F. S. Tautz, T. Seyller, C. Kumpf, F. Göhler, P. Schädlich, "Reversible switching of the environment-protected quantum spin Hall insulator bismuthene at the graphene/SiC interface", Nat. Commun. 16, 6171 (2025). https://doi.org/10.1038/s41467-025-60440-x
- H. Yin, M. Hutter, C. Wagner, F. S. Tautz, F. C. Bocquet, and C. Kumpf, “Epitaxial growth of mono- and (twisted) multilayer graphene on SiC(0001)”, Phys. Rev. Materials 9, 044003 (2025). https://doi.org/10.1103/PhysRevMaterials.9.044003
- S. Wolff, M. Hutter, P. Schädlich, H. Yin, M. Stettner, S. Wenzel, F. S. Tautz, F. C. Bocquet, T. Seyller, and C. Kumpf, “Bi-intercalated epitaxial graphene on SiC(0001)”, New Journal of Physics 26, 103009 (2024). https://doi.org/10.1088/1367-2630/ad7f7d
Last Modified: 01.08.2025