Diffraction Methods and Electron Microscopy

The banner image shows a LEEM image of a 0°-rotated monolayer graphene on a 6H-SiC(0001) substrate prepared via the surfactant-mediated growth method.

About

Diffraction methods provide quantitative structural information of periodic structures and are therefore complementary to scanning probe microscopies. We employ both, electron and x-ray diffraction, to study molecular and quantum materials. Our aberration-corrected electron spectromicroscope plays a special role here, as it combines nanometer-resolved microscopy with micro-diffraction and spectroscopic capabilities.

Research Topics

  • Aberration-corrected spectromicroscopy
  • Chemically-resolved vertical structures with sub-Angstrom resolution
  • Interfaces between molecules and crystalline phases
  • Epitaxial 2D materials

Contact

Prof. Dr. Christian Kumpf

PGI-3

Building 02.4w / Room 319

+49 2461/61-1452

E-Mail

Members

Hao YinPhD studentBuilding 02.4w / Room 128+49 2461/61-6313
Monja StettnerPhD studentBuilding 02.4w / Room 128+49 2461/61-6313
Recent Publications
  • H. Yin, M. Hutter, C. Wagner, F. S. Tautz, F. C. Bocquet, and C. Kumpf, “Epitaxial growth of mono- and (twisted) multilayer graphene on SiC(0001)”, arXiv:2411.11684 [cond-mat.mtrl-sci] (2024). https://doi.org/10.48550/arXiv.2411.11684
  • S. Wolff, M. Hutter, P. Schädlich, H. Yin, M. Stettner, S. Wenzel, F. S. Tautz, F. C. Bocquet, T. Seyller, and C. Kumpf, “Bi-intercalated epitaxial graphene on SiC(0001)”, New Journal of Physics 26, 103009 (2024). https://doi.org/10.1088/1367-2630/ad7f7d
  • Y.-R. Lin, S. Wolff, P. Schädlich, M. Hutter, S. Soubatch, T.-L. Lee, F. S. Tautz, T. Seyller, C. Kumpf, and F. C. Bocquet, “Vertical structure of Sb-intercalated quasifreestanding graphene on SiC(0001)”, Phys. Rev. B 106, 155418 (2022). https://doi.org/10.1103/PhysRevB.106.155418
Last Modified: 10.12.2024