Multi-tip Scanning Probe Microscopy

The banner image shows four tips of a multi-tip scanning probe microscope contacting a thin flake of the topological insulator BiBr for microscale electrical measurements.

About

We study the intriguing charge transport properties of quantum materials like topological insulators and novel 2D materials. For the best access to nanoscale charge transport properties, we develop novel multi-tip SPM instruments and corresponding measurement techniques.

Research Topics

  • Multi-tip SPM instrument development
  • Charge transport at nanostructures of quantum materials
  • Charge transport at surfaces

Contact

Prof. Dr. Bert Voigtländer

PGI-3

Building 02.4w / Room 318

+49 2461/61-4116

E-Mail

Members

Dr. Vasily CherepanovSenior scientistBuilding 02.4 / Room 322+49 2461/61-6636
Dr. Denis KrylovResearch engineerBuilding 02.4w / Room 129+49 2461/61-3403
Dr. Timofey BalashovPostdocBuilding 02.4w / Room 129+49 2461/61-3403
Jonathan Karl HofmannPhD studentBuilding 02.4w / Room 126+49 2461/61-6362
Recent Publications
  • J. K. Hofmann, H. Jeon, S. M. Hus, Y. Zhang, M. Zheng, T. Wichmann, A.-P. Li, J.-J. Zhou, Z. Wang, Y. Yao, B. Voigtländer, F. S. Tautz, and F. Lüpke, “Shear-resistant topology in quasi one-dimensional van der waals material Bi4Br4”, ArXiv:2411.13320 [cond-mat.mes-hall] (2024). https://doi.org/10.48550/arXiv.2411.13320
  • A. Leis, M. Schleenvoigt, K. Moors, H. Soltner, V. Cherepanov, P. Schüffelgen, G. Mussler, D. Grützmacher, B. Voigtländer, F. Lüpke, and F. S. Tautz, “Probing edge state conductance in ultra-thin topological insulator films”, Adv. Quan-
    tum Technol.
    5, 2200043 (2022). https://doi.org/10.1002/qute.202200043
  • A. Leis, V. Cherepanov, B. Voigtländer, and F. S. Tautz, “Nanoscale tip positioning with a multi-tip scanning tunneling microscope using topography images”, Rev. Sci. Instrum. 93, 013702 (2022). https://doi.org/10.1063/5.0073059

Last Modified: 07.02.2025