Multi-tip Scanning Probe Microscopy
The banner image shows four tips of a multi-tip scanning probe microscope contacting a thin flake of the topological insulator BiBr for microscale electrical measurements.
About
We study the intriguing charge transport properties of quantum materials like topological insulators and novel 2D materials. For the best access to nanoscale charge transport properties, we develop novel multi-tip SPM instruments and corresponding measurement techniques.
Research Topics
- Multi-tip SPM instrument development
- Charge transport at nanostructures of quantum materials
- Charge transport at surfaces
Members
Research
Recent Publications
- J. K. Hofmann, H. Jeon, S. M. Hus, Y. Zhang, M. Zheng, T. Wichmann, A.-P. Li, J.-J. Zhou, Z. Wang, Y. Yao, B. Voigtländer, F. S. Tautz, and F. Lüpke, “Shear-resistant topology in quasi one-dimensional van der waals material Bi4Br4”, ArXiv:2411.13320 [cond-mat.mes-hall] (2024). https://doi.org/10.48550/arXiv.2411.13320
- A. Leis, M. Schleenvoigt, K. Moors, H. Soltner, V. Cherepanov, P. Schüffelgen, G. Mussler, D. Grützmacher, B. Voigtländer, F. Lüpke, and F. S. Tautz, “Probing edge state conductance in ultra-thin topological insulator films”, Adv. Quan-
tum Technol. 5, 2200043 (2022). https://doi.org/10.1002/qute.202200043
- A. Leis, V. Cherepanov, B. Voigtländer, and F. S. Tautz, “Nanoscale tip positioning with a multi-tip scanning tunneling microscope using topography images”, Rev. Sci. Instrum. 93, 013702 (2022). https://doi.org/10.1063/5.0073059
Last Modified: 07.02.2025