Multi-tip Scanning Probe Microscopy

The banner image shows four tips of a multi-tip scanning probe microscope contacting a thin flake of the topological insulator BiBr for microscale electrical measurements.

About

We study the intriguing charge transport properties of quantum materials like topological insulators and novel 2D materials. For the best access to nanoscale charge transport properties, we develop novel multi-tip SPM instruments and corresponding measurement techniques.

Research Topics

  • Multi-tip SPM instrument development
  • Charge transport at nanostructures of quantum materials
  • Charge transport at surfaces

Contact

Prof. Dr. Bert Voigtländer

PGI-3

Building 02.4w / Room 318

+49 2461/61-4116

E-Mail

Members

Dr. Vasily CherepanovSenior scientist at Peter Grünberg Institute (PGI-3) Building 02.4 / Room 322+49 2461/61-6636
Dr. Denis KrylovResearch engineer at Peter Grünberg Institute (PGI-3) Building 02.4w / Room 129+49 2461/61-3403
Dr. Timofey BalashovPostdoc at Peter Grünberg Institute (PGI-3) Building 02.4w / Room 320+49 2461/61-3469
Jonathan Karl HofmannPostdoc at Peter Grünberg Institute (PGI-3) Building 02.4w / Room 126+49 2461/61-6362

Research

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Multi-tip SPM Instrument Development

In quantum nanoscience, it is essential to perform electronic transport measurements at the nanoscale. We design ultra-compact multi-tip scanning probe instruments with we use as a “multimeter at the nanoscale”.

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Charge Transport at Nanostructures of Quantum Materials

We reveal the nanoscale transport properties of thin films of promising quantum materials like topological insulators using multi-tip STM.

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Charge Transport at Surfaces

We acquire maps of the potential landscape which is generated by a current flowing along the surface or through a nanostructure (scanning tunnelling potentiometry). These maps give insight into fundamental transport properties of quantum materials, such as the influence of defects on the local electric transport.

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Probing Edge State Conductance

We introduce a robust method for effectively pinpointing ballistic edge channels, as opposed to trivial edge states, in quantum materials using nanoscale multi-tip transport experiments.

Recent Publications
  • J. K. Hofmann, H. Jeon, S. M. Hus, Y. Zhang, M. Zheng, T. Wichmann, A.-P. Li, J.-J. Zhou, Z. Wang, Y. Yao, B. Voigtländer, F. S. Tautz, and F. Lüpke, “Shear-resistant topology in quasi one-dimensional van der waals material Bi4Br4”, ArXiv:2411.13320 [cond-mat.mes-hall] (2024). https://doi.org/10.48550/arXiv.2411.13320
  • A. Leis, M. Schleenvoigt, K. Moors, H. Soltner, V. Cherepanov, P. Schüffelgen, G. Mussler, D. Grützmacher, B. Voigtländer, F. Lüpke, and F. S. Tautz, “Probing edge state conductance in ultra-thin topological insulator films”, Adv. Quan-
    tum Technol.     5, 2200043 (2022). https://doi.org/10.1002/qute.202200043
  • A. Leis, V. Cherepanov, B. Voigtländer, and F. S. Tautz, “Nanoscale tip positioning with a multi-tip scanning tunneling microscope using topography images”, Rev. Sci. Instrum. 93, 013702 (2022). https://doi.org/10.1063/5.0073059

Last Modified: 14.03.2025
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